The electromagnetic compatibility of integrated circuits—Past, present, and future M Ramdani, E Sicard, A Boyer, SB Dhia, JJ Whalen, TH Hubing, ... IEEE Transactions on Electromagnetic Compatibility 51 (1), 78-100, 2009 | 388 | 2009 |
Electromagnetic Compatibility of Integrated Circuits: Techniques for low emission and susceptibility S Ben Dhia, M Ramdani, E Sicard Springer Science & Business Media, 2006 | 359 | 2006 |
The challenge of signal integrity in deep-submicrometer CMOS technology F Caignet, S Ben Dhia, E Sicard Proceedings of the IEEE 89 (4), 556-573, 2001 | 201 | 2001 |
Basics of CMOS cell design E Sicard, S Ben Dhia Tata McGraw-Hill Education, 2005 | 108 | 2005 |
Modeling the electromagnetic emission of a microcontroller using a single model C Labussière-Dorgan, S Ben Dhia, E Sicard, J Tao, HJ Quaresma, ... Electromagnetic Compatibility, IEEE Transactions on 50 (1), 22-34, 2008 | 103 | 2008 |
Introducing 5-nm FinFET technology in Microwind E Sicard, L Trojman | 79 | 2021 |
Characterisation of electromagnetic susceptibility of integrated circuits using near-field scan A Boyer, S Ben Dhia, E Sicard Electronics Letters 43 (1), 15-16, 2007 | 74 | 2007 |
Advanced CMOS cell design E Sicard, S Ben Dhia Tata McGraw-Hill Education, 2007 | 65 | 2007 |
Characterization and modeling of parasitic emission in deep submicron CMOS B Vrignon, S Delmas Ben Dhia, E Lamoureux, E Sicard Electromagnetic Compatibility, IEEE Transactions on 47 (2), 382-387, 2005 | 60 | 2005 |
Near-field mapping system to scan in time domain the magnetic emissions of integrated circuits T Ordas, M Lisart, E Sicard, P Maurine, L Torres Integrated Circuit and System Design. Power and Timing Modeling …, 2009 | 59 | 2009 |
Effective teaching of the physical design of integrated circuits using educational tools SM Aziz, E Sicard, SB Dhia IEEE Transactions on Education 53 (4), 517-531, 2009 | 57 | 2009 |
Introducing 65 nm technology in Microwind3 E Sicard, SM Aziz | 47 | 2011 |
Microwind & Dsch: Version 3 E Sicard, SB Dhia INSA, 2004 | 46* | 2004 |
Modeling and simulation of LDO voltage regulator susceptibility to conducted EMI J Wu, A Boyer, J Li, B Vrignon, SB Dhia, E Sicard, R Shen IEEE Transactions on Electromagnetic Compatibility 56 (3), 726-735, 2014 | 43 | 2014 |
Analysis of crosstalk interference in CMOS integrated circuits E Sicard, A Rubio IEEE transactions on electromagnetic compatibility 34 (2), 124-129, 1992 | 43 | 1992 |
Modelling of a direct power injection aggression on a 16 bit microcontroller input buffer A Boyer, S Ben Dhia, E Sicard EMC Compo 2007 - Torino, 27-30/11/2007, 35-39, 2007 | 37* | 2007 |
Characterisation of microcontroller susceptibility to radio frequency interference S Baffreau, S Ben Dhia, M Ramdani, E Sicard Devices, Circuits and Systems, 2002. Proceedings of the Fourth IEEE …, 2002 | 34 | 2002 |
On-chip sampling in CMOS integrated circuits S Delmas-Bendhia, F Caignet, E Sicard, M Roca IEEE Transactions on Electromagnetic Compatibility 41 (4), 403-406, 1999 | 34 | 1999 |
Towards an EMC roadmap for Integrated Circuits S Ben Dhia, M Ramdani, E Sicard 2008 Asia-Pacific Symposium on Electromagnetic Compatibility and 19th …, 2008 | 31* | 2008 |
Electromagnetic near-field scanning for microelectronic test chip investigation A Tankielun, U Keller, E Sicard, P Kralicek, B Vrignon IEEE EMC society newsletter 68, 2006 | 29 | 2006 |