| Ellipsometric and ultrasonic studies of nano titanium dioxide specimens doped with Erbium SM Al-Shomar, MAY Barakat, AW Abdallah Materials Research Express 7 (10), 106413, 2020 | 13 | 2020 |
| A precise method for determining the principal angle of incidence and the optical constants of metals NN Nagib, MS Bahrawi, H Osman, NA Mahmoud, MH Osman, ... Measurement Science and Technology 27 (1), 015009, 2015 | 12 | 2015 |
| Novel wide-angle ellipsometric arrangement for thin film thickness measurement AW Abdallah, R Tutsch, NN Nagib Journal of Physics Communications 2 (5), 055007, 2018 | 7 | 2018 |
| Evaluation of a photometric method for retardance measurement of a quarterwave phase plate NN Nagib, MS Bahrawi, LZ Ismail, MH Othman, AW Abdallah Optics & Laser Technology 69, 77-79, 2015 | 7 | 2015 |
| A modified method for calibration of polarimetric components using polarizing interferometry AW Abdallah, M Abdelwahab Measurement Science and Technology 32 (11), 115003, 2021 | 6 | 2021 |
| Determination of a grown oxide layer thickness and optical constants of Zn and Cd metals M Shehata, AW Abdallah, SS Ibrahim, MH Osman, NN Nagib Optik 232, 166552, 2021 | 6 | 2021 |
| Polarization metrology: Alignment of polarizing prisms in optical polarization systems NN Nagib, MS Bahrawi, LZ Ismail, MH Othman, AW Abdallah Optics & Laser Technology 54, 42-44, 2013 | 6 | 2013 |
| Evaluation of new designed reference blocks for calibration and NDT by optical and ultrasonic techniques MAY Barakat, M Abdelwahab, AW Abdallah Metrology and Measurement Systems, 719-736-719-736, 2022 | 4 | 2022 |
| Developed method to evaluate some optical parameters in gauge block measurements using ellipsometry AW Abdallah, M Abdelwahab, M El-Bahrawy Mapan 37 (2), 319-328, 2022 | 2 | 2022 |
| Novel polarimetric method for determination of the Brewster angle of a dielectric NN Nagib, A Abdallah, M Bahrawi, E Mousa Results in Optics 1, 100006, 2020 | 2 | 2020 |
| Ultrasonic and Optical Investigation of Mercury Content Influence on Metrological Properties of Reference Alloy Materials MAY Barakat, AW Abdallah Journal of Measurement Science and Applications (JMSA), 2023 | | 2023 |
| Interferometric Imaging Ellipsometer for Characterizing the Physical Parameters of a Grown Oxide Layer AW Abdallah, N Farid MAPAN 38 (1), 161-168, 2023 | | 2023 |
| Spectral dependences of the principal angle of incidence and quasi polarizing angle of metals AW Abdallah, NA Mahmoud, NN Nagib Óptica Pura y Aplicada 54 (4), 2021 | | 2021 |
| Wide angle ellipsometry for measuring the optical properties of a metal AW Abdallah, NN Nagib IOSR Journal of Applied Physics 13 (5), 47 - 51, 2021 | | 2021 |
| Proposed method for phase retardation measurements using polarimetric techniques AW Abdallah Global Journal of Engineering and Technology Advances 9 (2), 054-056, 2021 | | 2021 |
| Simple Method for Determining Retardance and Birefringence of Bended Single-Mode Fiber AW Abdallah, NN Nagib, AM Saad International Journal of Photonics and Optical Technology 2 (5), 7-9, 2019 | | 2019 |
| Simple Method for Measuring Small Retardance NN Nagib, AW Abdallah, MS Bahrawi, H Osman, NA Mahmoud, ... Themes in Applied Sciences Research 1 (1), 1-3, 2018 | | 2018 |
Nabil N NagibNational Institute for Standards, Egypt
Nabil N NagibNational Institute for Standards, Egypt