Get my own profile
Public access
View all15 articles
18 articles
available
not available
Based on funding mandates
Co-authors
Ron SchrimpfProfessor of Electrical Engineering, Vanderbilt UniversityVerified email at vanderbilt.edu
Daniel M. FleetwoodProfessor of Electrical Engineering, Vanderbilt UniversityVerified email at vanderbilt.edu
Robert A ReedVanderbilt UniversityVerified email at vanderbilt.edu
Arthur WitulskiResearch Professor Electrical Engineering, Vanderbilt UniversityVerified email at vanderbilt.edu
Andrew SternbergVanderbilt UniversityVerified email at vanderbilt.edu
Arto JavanainenJyväskylä UniversityVerified email at jyu.fi
Enxia ZhangUniversity of Central FloridaVerified email at ucf.edu
Michael AllesVanderbilt UniversityVerified email at vanderbilt.edu
Lloyd MassengillVanderbilt UniversityVerified email at vanderbilt.edu
C. ClaeysProfessor KU LeuvenVerified email at kuleuven.be
Bo Kyoung ChoiMTEGVerified email at mteg.co.kr
Robert A. WellerVanderbilt UniversityVerified email at vanderbilt.edu
Steven KosierVanderbilt UniversityVerified email at Vanderbilt.edu
Brian SierawskiResearch Associate Professor, Vanderbilt UniversityVerified email at vanderbilt.edu
jerome bochmontpellier universityVerified email at umontpellier.fr
Chaoming LiuHarbin Institute of TechnologyVerified email at hit.edu.cn
Ari VirtanenUniversity of JyväskyläVerified email at jyu.fi
Liang WangBeijing Microelectronics Technology InstituteVerified email at vanderbilt.edu
Dale P. McMorrowNaval Research LaboratoryVerified email at nrl.navy.mil
Dunbar P. Birnie, IIIRutgers UniversityVerified email at rutgers.edu