| Active scanning probes: A versatile toolkit for fast imaging and emerging nanofabrication IW Rangelow, T Ivanov, A Ahmad, M Kaestner, C Lenk, IS Bozchalooi, ... Journal of Vacuum Science & Technology B 35 (6), 2017 | 100 | 2017 |
| Advanced atomic force microscopy modes for biomedical research F Xia, K Youcef-Toumi Biosensors 12 (12), 1116, 2022 | 47 | 2022 |
| Charge controller with decoupled and self-compensating configurations for linear operation of piezoelectric actuators in a wide bandwidth C Yang, C Li, F Xia, Y Zhu, J Zhao, K Youcef-Toumi IEEE Transactions on Industrial Electronics 66 (7), 5392-5402, 2018 | 36 | 2018 |
| Modeling and control of piezoelectric hysteresis: A polynomial-based fractional order disturbance compensation approach C Yang, N Verbeek, F Xia, Y Wang, K Youcef-Toumi IEEE Transactions on Industrial Electronics 68 (4), 3348-3358, 2020 | 30 | 2020 |
| A modular low-cost atomic force microscope for precision mechatronics education F Xia, J Quigley, X Zhang, C Yang, Y Wang, K Youcef-Toumi Mechatronics 76, 102550, 2021 | 19 | 2021 |
| Comprehensive study of charge-based motion control for piezoelectric nanopositioners: Modeling, instrumentation and controller design C Yang, F Xia, Y Wang, K Youcef-Toumi Mechanical Systems and Signal Processing 166, 108477, 2022 | 16 | 2022 |
| Lights out! nano-scale topography imaging of sample surface in opaque liquid environments with coated active cantilever probes F Xia, C Yang, Y Wang, K Youcef-Toumi, C Reuter, T Ivanov, M Holz, ... Nanomaterials 9 (7), 1013, 2019 | 14 | 2019 |
| Design and Control of a Multi-actuated High-bandwidth and Large-range Scanner for Atomic Force Microscopy F Xia, S Truncale, Y Wang, K Youcef-Toumi 2018 Annual American Control Conference (ACC), 4330-4335, 2018 | 13 | 2018 |
| Induced vibration contact detection for minimizing cantilever tip-sample interaction forces in jumping mode atomic force microscopy F Xia, IS Bozchalooi, K Youcef-Toumi 2017 American Control Conference (ACC), 4141-4146, 2017 | 13 | 2017 |
| Bandwidth Based Repetitive Controller Design for a Modular Multi-actuated AFM Scanner F Xia, C Yang, Y Wang, K Youcef-Toumi 2019 American Control Conference (ACC), 3776-3781, 2019 | 11 | 2019 |
| Design and Control of a Multi-Actuated Nanopositioning Stage with Stacked Structure C Yang, F Xia, Y Wang, S Truncale, K Youcef-Toumi 2019 American Control Conference (ACC), 3782-3788, 2019 | 10 | 2019 |
| Statically stable charge sensing method for precise displacement estimation of piezoelectric stack-based nanopositioning C Yang, N Verbeek, F Xia, Y Wang, K Youcef-Toumi IEEE Transactions on Industrial Electronics 68 (9), 8550-8560, 2020 | 7 | 2020 |
| Design and Control of Versatile High-speed and Large-range Atomic Force Microscopes F Xia Massachusetts Institute of Technology, 2020 | 7 | 2020 |
| Model and Controller Design for High-speed Atomic Force Microscope Imaging and Autotuning F Xia, C Yang, Y Wang, K Youcef-Toumi 2020 ASPE Spring Topical Meeting on Design and Control of Precision …, 2020 | 5 | 2020 |
| AFM SMILER: A scale model interactive learning extended reality toolkit for atomic force microscopy created with digital twin technology F Xia, S Lovett, E Forsythe, M Ibrahim, K Youcef-Toumi IEEE/ASME Transactions on Mechatronics 28 (4), 2101-2109, 2023 | 4 | 2023 |
| Disturbance rejection control for active vibration suppression of overhead hoist transport vehicles in semiconductor Fabs J Qiu, H Kim, F Xia, K Youcef-Toumi Machines 11 (2), 125, 2023 | 4 | 2023 |
| Physical intelligence in the metaverse: Mixed reality scale models for twistronics and atomic force microscopy F Xia, MP Mayborne, Q Ma, K Youcef-Toumi 2022 IEEE/ASME International Conference on Advanced Intelligent Mechatronics …, 2022 | 4 | 2022 |
| Robotic method and instrument to efficiently synthesize faulty conditions and mass-produce faulty-conditioned data for rotary machines YF Yeung, F Xia, J Covarrubias, M Furokawa, T Hirano, K Youcef-Toumi 2023 IEEE International Conference on Robotics and Automation (ICRA), 11382 …, 2023 | 3 | 2023 |
| Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection F Xia, IW Rangelow, T Sattel, E Manske, K Youcef-Toumi Journal of Visualized Experiments, 2023 | 3 | 2023 |
| Design and control optimization for high-speed jumping mode Atomic Force Microscope F Xia Massachusetts Institute of Technology, 2017 | 3 | 2017 |