Articles with public access mandates - Ertugrul DemircanLearn more
Not available anywhere: 1
Voltage-based electromigration immortality check for general multi-branch interconnects
Z Sun, E Demircan, MD Shroff, T Kim, X Huang, SXD Tan
2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-7, 2016
Mandates: US National Science Foundation
Available somewhere: 3
Fast electromigration stress evolution analysis for interconnect trees using Krylov subspace method
C Cook, Z Sun, E Demircan, MD Shroff, SXD Tan
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (5), 969-980, 2018
Mandates: US National Science Foundation, US Department of Defense
Fast electromigration immortality analysis for multisegment copper interconnect wires
Z Sun, E Demircan, MD Shroff, C Cook, SXD Tan
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2018
Mandates: US National Science Foundation, US Department of Defense
Full-chip wire-oriented back-end-of-line TDDB hotspot detection and lifetime analysis
S Peng, E Demircan, MD Shroff, SXD Tan
Integration 70, 90-98, 2020
Mandates: US National Science Foundation
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