| Development of a parametric model and virtual machine to estimate task specific measurement uncertainty for a five-axis multi-sensor coordinate measuring machine P Ramu, JA Yagüe, RJ Hocken, J Miller Precision Engineering 35 (3), 431-439, 2011 | 51 | 2011 |
| X-ray calibrated tunneling system utilizing a dimensionally stable nanometer positioner JA Miller, R Hocken, ST Smith, S Harb Precision engineering 18 (2), 95-102, 1996 | 31 | 1996 |
| Approach for uncertainty analysis and error evaluation of four-axis co-ordinate measuring machines JB de Aquino Silva, RJ Hocken, JA Miller, GW Caskey, P Ramu The International Journal of Advanced Manufacturing Technology 41 (11), 1130 …, 2009 | 25 | 2009 |
| A technique for enhancing machine tool accuracy by transferring the metrology reference from the machine tool to the workpiece BA Woody, KS Smith, RJ Hocken, JA Miller Journal of manufacturing science and engineering 129 (3), 636-643, 2007 | 24 | 2007 |
| Improving the accuracy of large scale monolithic parts using fiducials S Smith, BA Woody, JA Miller CIRP Annals-Manufacturing Technology 54 (1), 483-486, 2005 | 23 | 2005 |
| Scanning tunneling microscopy bit making on highly oriented pyrolytic graphite: Initial results JA Miller, RJ Hocken Journal of applied physics 68 (2), 905-907, 1990 | 19 | 1990 |
| Deformation mechanisms in single crystal Ni-based concentrated solid solution alloys by nanoindentation L Yang, Y Chen, J Miller, WJ Weber, H Bei, Y Zhang Materials Science and Engineering: A 865, 143685, 2022 | 18 | 2022 |
| Application of cat's-eye retroreflector in micro-displacement measurement D Ren, KM Lawton, JA Miller Precision engineering 31 (1), 68-71, 2007 | 18 | 2007 |
| Nanotechnology and its impact on manufacturing RJ Hocken, JA Miller Tokyo: Japan/USA Symposium on Flexible Auto-mation 15, 1993 | 17 | 1993 |
| Accurate measurement of trivalent silicon interface trap density using small signal steady‐state methods JA Miller, C Blat, EH Nicollian Journal of applied physics 66 (2), 716-721, 1989 | 17 | 1989 |
| Error mapping of rotary tables in 4-axis measuring devices using a ball plate artifact Q Wang, J Miller, A Von Freyberg, N Steffens, A Fischer, G Goch CIRP Annals 67 (1), 559-562, 2018 | 13 | 2018 |
| A double-pass interferometer for measurement of dimensional changes D Ren, KM Lawton, JA Miller Measurement Science and Technology 19 (2), 025303, 2008 | 13 | 2008 |
| Fiducial calibration systems and methods for manufacturing, inspection, and assembly JA Miller US Patent 6,782,596, 2004 | 13 | 2004 |
| Fiducial calibration systems and methods for manufacturing, inspection, and assembly J Miller US Patent App. 10/007,051, 2002 | 13 | 2002 |
| Concurrent engineering of a next-generation freeform telescope: metrology and test T Noste, CJ Evans, JA Miller, LE Hopper Advanced Optics for Imaging Applications: UV through LWIR IV 10998, 109980Y, 2019 | 11 | 2019 |
| Toward specification of complex additive manufactured metal surfaces for optimum heat transfer K Mandloi, C Evans, J Fox, H Cherukuri, J Miller, A Allen, D Deisenroth, ... Proc. Jt. Spec. Interest Group Meet. Euspen ASPE, St. Gallen, Switzerland, 2021 | 6 | 2021 |
| Error sources, compensation, and probe path optimization for on-machine metrology of freeform optics L Hopper, T Noste, J Miller, C Evans Optical Manufacturing and Testing XIII 11487, 39-49, 2020 | 6 | 2020 |
| Fiducial calibration method and system for assembling parts JA Miller US Patent 7,073,239, 2006 | 6 | 2006 |
| In-Situ Infrared(IR) Detection and Heating of the High Pressure Phase of Silicon during Scratching Test L Dong, JA Patten, JA Miller Surface Engineering 2004--Fundamentals and Applications, 271-276, 2005 | 6* | 2005 |
| In-situ infrared detection and heating of metallic phase of silicon during scratching test L Dong, JA Patten, JA Miller International journal of manufacturing technology and management 7 (5-6 …, 2005 | 6 | 2005 |
