Input prioritization for testing neural networks T Byun, V Sharma, A Vijayakumar, S Rayadurgam, D Cofer 2019 IEEE International Conference On Artificial Intelligence Testing …, 2019 | 75 | 2019 |
Run-time assurance for learning-based aircraft taxiing D Cofer, I Amundson, R Sattigeri, A Passi, C Boggs, E Smith, L Gilham, ... 2020 AIAA/IEEE 39th Digital Avionics Systems Conference (DASC), 1-9, 2020 | 31 | 2020 |
Manifold for machine learning assurance T Byun, S Rayadurgam Proceedings of the ACM/IEEE 42nd International Conference on Software …, 2020 | 31 | 2020 |
Run-time assurance for learning-enabled systems D Cofer, I Amundson, R Sattigeri, A Passi, C Boggs, E Smith, L Gilham, ... NASA Formal Methods: 12th International Symposium, NFM 2020, Moffett Field …, 2020 | 22 | 2020 |
Constraint-based test generation for automotive operating systems Y Choi, T Byun Software & Systems Modeling 16, 7-24, 2017 | 22 | 2017 |
Efficient safety checking for automotive operating systems using property-based slicing and constraint-based environment generation Y Choi, M Park, T Byun, D Kim Science of Computer Programming 103, 51-70, 2015 | 16 | 2015 |
Black-box testing of deep neural networks T Byun, S Rayadurgam, MPE Heimdahl 2021 IEEE 32nd International Symposium on Software Reliability Engineering …, 2021 | 11 | 2021 |
Manifold-based test generation for image classifiers T Byun, S Rayadurgam Proceedings of the IEEE/ACM 42nd International Conference on Software …, 2020 | 11 | 2020 |
Property-based code slicing for efficient verification of osek/vdx operating systems M Park, T Byun, Y Choi arXiv preprint arXiv:1301.0042, 2013 | 10 | 2013 |
Property-based testing for LG home appliances using accelerated software-in-the-loop simulation M Park, H Jang, T Byun, Y Choi Proceedings of the ACM/IEEE 42nd International Conference on Software …, 2020 | 9 | 2020 |
Toward rigorous object-code coverage criteria T Byun, V Sharma, S Rayadurgam, S McCamant, MPE Heimdahl 2017 IEEE 28th International Symposium on Software Reliability Engineering …, 2017 | 8 | 2017 |
Automated system-level safety testing using constraint patterns for automotive operating systems T Byun, Y Choi Proceedings of the 30th Annual ACM Symposium on Applied Computing, 1815-1822, 2015 | 8 | 2015 |
Binary Mutation Analysis of Tests Using Reassembleable Disassembly N Emamdoost, V Sharma, T Byun, S McCamant | 3 | 2019 |
Discovering instructions for robust binary-level coverage criteria V Sharma, T Byun, S Rayadurgam, MPE Heimdahl | 3 | 2017 |
Contract discovery from black-box components V Sharma, T Byun, S McCamant, S Rayadurgam, MPE Heimdahl Proceedings of the 1st ACM SIGSOFT International Workshop on Automated …, 2018 | | 2018 |
차량전장용 운영체제 검증 사례를 통한 소프트웨어 안전성 검증 기법 소개 최윤자, 변태준 정보처리학회지 21 (4), 48-55, 2014 | | 2014 |
Automatic Test Scenario Generator for OSEK/VDX-based Automotive Operating Systems T Byun, Y Choi Proceedings of the Korea Information Processing Society Conference, 1551-1554, 2012 | | 2012 |
2021 IEEE 32nd International Symposium on Software Reliability Engineering (ISSRE)| 978-1-6654-2587-2/21/$31.00© 2021 IEEE| DOI: 10.1109/ISSRE52982. 2021.00066 R Abreu, P Adão, SV Adve, E Al-Hossami, G An, P Arcaini, A Arcuri, ... | | |