| Characterization of nanoparticles through medium-energy ion scattering MA Sortica, PL Grande, G Machado, L Miotti Journal of Applied Physics 106 (11), 2009 | 75 | 2009 |
| Systematic compositional analysis of sputter-deposited boron-containing thin films B Bakhit, D Primetzhofer, E Pitthan, MA Sortica, E Ntemou, J Rosen, ... Journal of Vacuum Science & Technology A 39 (6), 2021 | 36 | 2021 |
| Electronic energy-loss mechanisms for H, He, and Ne in TiN MA Sortica, V Paneta, B Bruckner, S Lohmann, M Hans, T Nyberg, ... Physical Review A 96 (3), 032703, 2017 | 34 | 2017 |
| A versatile time-of-flight medium-energy ion scattering setup using multiple delay-line detectors MA Sortica, MK Linnarsson, D Wessman, S Lohmann, D Primetzhofer Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2020 | 33 | 2020 |
| Quantitative compositional profiling of conjugated quantum dots with single atomic layer depth resolution via time-of-flight medium-energy ion scattering spectroscopy KW Jung, H Yu, WJ Min, KS Yu, MA Sortica, PL Grande, DW Moon Analytical chemistry 86 (2), 1091-1097, 2014 | 29 | 2014 |
| Age hardening in superhard ZrB2-rich Zr1-xTaxBy thin films B Bakhit, J Palisaitis, Z Wu, MA Sortica, D Primetzhofer, POÅ Persson, ... Scripta Materialia 191, 120-125, 2021 | 28 | 2021 |
| Effect of nitrogen vacancies on the growth, dislocation structure, and decomposition of single crystal epitaxial (Ti1-xAlx) Ny thin films KM Calamba, J Salamania, MPJ Jõesaar, LJS Johnson, R Boyd, ... Acta Materialia 203, 116509, 2021 | 27 | 2021 |
| Signature of plasmon excitations in the stopping ratio of fast hydrogen clusters SM Shubeita, MA Sortica, PL Grande, JF Dias, NR Arista Physical Review B—Condensed Matter and Materials Physics 77 (11), 115327, 2008 | 27 | 2008 |
| Structural control of gold nanoparticles self-assemblies by layer-by-layer process G Machado, AF Feil, P Migowski, L Rossi, M Giovanela, JS Crespo, ... Nanoscale 3 (4), 1717-1723, 2011 | 26 | 2011 |
| Electronic interaction of slow hydrogen and helium ions with nickel-silicon systems TT Tran, L Jablonka, B Bruckner, S Rund, D Roth, MA Sortica, P Bauer, ... Physical Review A 100 (3), 032705, 2019 | 22 | 2019 |
| Structural characterization of CdSe/ZnS quantum dots using medium energy ion scattering MA Sortica, PL Grande, C Radtke, LG Almeida, R Debastiani, JF Dias, ... Applied Physics Letters 101 (2), 2012 | 22 | 2012 |
| Structural characterization of Pb nanoislands in SiO2/Si interface synthesized by ion implantation through MEIS analysis DF Sanchez, FP Luce, ZE Fabrim, MA Sortica, PFP Fichtner, PL Grande Surface science 605 (7-8), 654-658, 2011 | 19 | 2011 |
| On the Z1-dependence of electronic stopping in TiN MA Sortica, V Paneta, B Bruckner, S Lohmann, T Nyberg, P Bauer, ... Scientific Reports 9 (1), 176, 2019 | 18 | 2019 |
| Analysis of photon emission induced by light and heavy ions in time-of-flight medium energy ion scattering S Lohmann, MA Sortica, V Paneta, D Primetzhofer Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2018 | 18 | 2018 |
| Multicomponent TixNbCrAl nitride films deposited by dc and high-power impulse magnetron sputtering R Shu, H Du, G Sadowski, MM Dorri, J Rosen, MA Sortica, D Primetzhofer, ... Surface and Coatings Technology 426, 127743, 2021 | 15 | 2021 |
| Isotopic labeling study of oxygen diffusion in amorphous LaScO3 high-κ films on Si(100) and its effects on the electrical characteristics JMJ Lopes, U Littmark, M Roeckerath, E Durǧun Özben, S Lenk, U Breuer, ... Applied Physics A 96, 447-451, 2009 | 12 | 2009 |
| Influence of Metal Substitution and Ion Energy on Microstructure Evolution of High-Entropy Nitride (TiZrTaMe)N1–x (Me = Hf, Nb, Mo, or Cr) Films R Shu, D Lundin, B Xin, MA Sortica, D Primetzhofer, M Magnuson, ... ACS Applied Electronic Materials 3 (6), 2748-2756, 2021 | 11 | 2021 |
| X-ray photoelectron spectroscopy analysis of TiBx (1.3≤ x≤ 3.0) thin films N Hellgren, G Greczynski, MA Sortica, I Petrov, L Hultman, J Rosen Journal of Vacuum Science & Technology A 39 (2), 2021 | 10 | 2021 |
| On the influence of uncertainties in scattering potentials on quantitative analysis using keV ions B Bruckner, T Strapko, MA Sortica, P Bauer, D Primetzhofer Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2020 | 10 | 2020 |
| Elemental depth profiling of intact metal–organic framework single crystals by scanning nuclear microprobe BD McCarthy, T Liseev, MA Sortica, V Paneta, W Gschwind, G Nagy, S Ott, ... Journal of the American Chemical Society 143 (44), 18626-18634, 2021 | 9 | 2021 |
Daniel PrimetzhoferProfessor of Experimental Physics, Department of Physics and Astronomy, Uppsala UniversityVerified email at physics.uu.se
