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Co-authors
- Hyunhyub KoUlsan National Institute of Science and Technology (UNIST)Verified email at unist.ac.kr
- Youngoh LeeWeldon School of Biomedical Engineering, Purdue UniversityVerified email at purdue.edu
- Jonghwa ParkElectrical Engineering & Computer Sciences, UC BerkeleyVerified email at berkeley.edu
- Seungse ChoSamsung ElectronicsVerified email at samsung.com
- Ayoung ChoeGeorgia Institute of TechnologyVerified email at gatech.edu
- Young-Eun ShinNational University of SingaporeVerified email at nus.edu.sg
- Jeonghee YeomCalifornia Institute of TechnologyVerified email at caltech.edu
- Saewon KangKorea Research Institute of Chemical Technology (KRICT)Verified email at gatech.edu
- Dong-hee KangGeorgia Institute of TechnologyVerified email at gatech.edu
- Vladimir TsukrukGeorgia TechVerified email at mse.gatech.edu
- Jisoo JeonGeorgia Institute of TechnologyVerified email at gatech.edu
- Minkyu KimAssistant Professor of Chemical Engineering, Dankook UniversityVerified email at dankook.ac.kr
- Moon Jong HanGachon UniversityVerified email at gachon.ac.kr
- U Jeong YangGeorgia techVerified email at gatech.edu