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Xianhu Liang
Xianhu Liang
University of Wuerzburg, Faculty of Physics and astronomy, EP3
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Year
Electronic synapses made of layered two-dimensional materials
Y Shi, X Liang, B Yuan, V Chen, H Li, F Hui, Z Yu, F Yuan, E Pop, ...
Nature Electronics 1 (8), 458-465, 2018
5732018
Wafer-scale integration of two-dimensional materials in high-density memristive crossbar arrays for artificial neural networks
S Chen, MR Mahmoodi, Y Shi, C Mahata, B Yuan, X Liang, C Wen, F Hui, ...
Nature Electronics 3 (10), 638-645, 2020
3122020
Advanced Data Encryption​ using 2D Materials
C Wen, X Li, T Zanotti, FM Puglisi, Y Shi, F Saiz, A Antidormi, S Roche, ...
Advanced Materials 33 (27), 2100185, 2021
912021
Graphene–boron nitride–graphene cross-point memristors with three stable resistive states
K Zhu, X Liang, B Yuan, MA Villena, C Wen, T Wang, S Chen, F Hui, Y Shi, ...
ACS applied materials & interfaces 11 (41), 37999-38005, 2019
722019
150 nm× 200 nm cross‐point hexagonal boron nitride‐based memristors
B Yuan, X Liang, L Zhong, Y Shi, F Palumbo, S Chen, F Hui, X Jing, ...
Advanced Electronic Materials 6 (12), 1900115, 2020
372020
Advanced data encryption using two-dimensional materials
M Lanza, C Wen, X Li, T Zanotti, FM Puglisi, Y Shi, F Saiz, A Antidormi, ...
Adv. Mater 33 (2100185.10), 1002, 2021
252021
Micro organic light emitting diode arrays by patterned growth on structured polypyrrole
J Li, Y Hu, X Liang, J Chen, L Zhong, L Liao, L Jiang, H Fuchs, W Wang, ...
Advanced Optical Materials 8 (10), 1902105, 2020
252020
Variability of metal/h-BN/metal memristors grown via chemical vapor deposition on different materials
MA Villena, F Hui, X Liang, Y Shi, B Yuan, X Jing, K Zhu, S Chen, ...
Microelectronics Reliability 102, 113410, 2019
252019
Bimodal dielectric breakdown in electronic devices using chemical vapor deposited hexagonal boron nitride as dielectric
F Palumbo, X Liang, B Yuan, Y Shi, F Hui, MA Villena, M Lanza
Advanced Electronic Materials 4 (3), 1700506, 2018
172018
Graphene coated nanoprobes: A review
F Hui, S Chen, X Liang, B Yuan, X Jing, Y Shi, M Lanza
Crystals 7 (9), 269, 2017
172017
Tristate resistive switching in heterogenous van der Waals dielectric structures
K Zhu, X Liang, B Yuan, MA Villena, C Wen, T Wang, S Chen, M Lanza, ...
2019 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2019
32019
150 nm× 200 nm cross point hexagonal boron nitride based memristors with ultra-low currents in high resistive state
X Liang, B Yuan, Y Shi, F Palumbo, S Chen, F Hui, X Jing, MA Villena, ...
2019 Electron Devices Technology and Manufacturing Conference (EDTM), 258-260, 2019
32019
Realization of smooth side profile using diffusion-controlled wet chemical etching for HgTe/(Hg, Cd) Te heterostructures
P Shekhar, K Bendias, L Fürst, X Liang, MK Gbordzoe, T Borzenko, ...
Nanotechnology 34 (20), 205302, 2023
22023
Data Encryption: Advanced Data Encryption​ using 2D Materials (Adv. Mater. 27/2021)
C Wen, X Li, T Zanotti, FM Puglisi, Y Shi, F Saiz, A Antidormi, S Roche, ...
Advanced Materials 33 (27), 2170205, 2021
12021
Uniformity of multilayer hexagonal boron nitride dielectric stacks grown by chemical vapor deposition on platinum and copper substrates
F Hui, X Liang, W Fang, WS Leong, H Wang, HY Yang, Y Shi, MA Villena, ...
2018 IEEE International Symposium on the Physical and Failure Analysis of …, 2018
12018
Enhanced reliability of hexagonal boron nitride dielectric stacks due to high thermal conductivity
X Liang, B Yuan, Y Shi, F Hui, X Jing, M Lanza, F Palumbo
2018 IEEE International Reliability Physics Symposium (IRPS), P-GD. 6-1-P-GD …, 2018
12018
Two-dimensional-materials-based transistors using hexagonal boron nitride dielectrics and metal gate electrodes with high cohesive energy
Y Shen, K Zhu, Y Xiao, D Waldhör, AH Basher, T Knobloch, S Pazos, ...
Nature Electronics, 1-12, 2024
2024
Period-doubling in the phase dynamics of a shunted HgTe quantum well Josephson junction
W Liu, SU Piatrusha, X Liang, S Upadhyay, L Fürst, C Gould, J Kleinlein, ...
arXiv preprint arXiv:2408.06119, 2024
2024
Graphite/h-BN van der Waals heterostructure as a gate stack for HgTe quantum wells
X Liang, S Shamim, D Chen, L Fürst, T Taniguchi, K Watanabe, ...
Nanotechnology, 2024
2024
Wafer-scale integration of two-dimensional materials in high-density memristive crossbar arrays for artificial neural networks. Nature Electronics 3, 10 (2020), 638–645
S Chen, MR Mahmoodi, Y Shi, C Mahata, B Yuan, X Liang, C Wen
2020
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