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Co-authors
- Wei QiaoClyde Hyde Professor (IEEE Fellow), Department of Electrical and Computer Engineering, University ofVerified email at unl.edu
- Liyan QuAssociate Professor, Department of Electrical and Computer Engineering, University of Nebraska-LincolnVerified email at unl.edu
- Taesic KimUniversity of MissouriVerified email at missouri.edu
- Zhe ZhangEaton Corporate Research and Technology (CRT)Verified email at eaton.com
- Xia DuUniversity of ArkansasVerified email at uark.edu
- Chun WeiZhejiang University of TechonologyVerified email at huskers.unl.edu
- Yue ZhaoAssociate Professor of Electrical Engineering at University of ArkansasVerified email at uark.edu
- BoHyun AhnPh.D. in Engineering (Specialized in Cybersecurity and Electrical Engineering)Verified email at ieee.org
- Qun ZhangMinnesota State University, MankatoVerified email at mnsu.edu
- Jerry L HudginsVerified email at unl.edu
- Junhui ZhaoUniversity of New HavenVerified email at newhaven.edu
- Ramkrishna MishanUniversity of Nevada, RenoVerified email at unr.edu