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M T Lin
M T Lin
Professor of Graduate Institute of Precision Engineering, National Chung Hsing University
Verified email at nchu.edu.tw - Homepage
Title
Cited by
Cited by
Year
Heat dissipation design and analysis of high power LED array using the finite element method
HH Cheng, DS Huang, MT Lin
Microelectronics Reliability 52 (5), 905-911, 2012
1942012
Design of fins with a grooved heat pipe for dissipation of heat from high-powered automotive LED headlights
DS Huang, TC Chen, LT Tsai, MT Lin
Energy conversion and management 180, 550-558, 2019
682019
Influence of in situ applied stress during thermal oxidation of (111)Si on interface defects
A Stesmans, D Pierreux, RJ Jaccodine, MT Lin, TJ Delph
Applied physics letters 82 (18), 3038-3040, 2003
432003
Novel microtensile method for monotonic and cyclic testing of freestanding copper thin films
MT Lin, CJ Tong, KS Shiu
Experimental Mechanics 50, 55-64, 2010
312010
Driving forces for texture transformation in thin Ag films
EA Ellis, M Chmielus, MT Lin, H Joress, K Visser, A Woll, RP Vinci, ...
Acta Materialia 105, 495-504, 2016
282016
Thin-film vertical-type AlGaInP LEDs fabricated by epitaxial lift-off process via the patterned design of Cu substrate
FL Wu, SL Ou, YC Kao, CL Chen, MC Tseng, FC Lu, MT Lin, RH Horng
Optics Express 23 (14), 18156-18165, 2015
282015
Temperature-dependent microtensile testing of thin film materials for application to microelectromechanical system
MT Lin, P El-Deiry, RR Chromik, N Barbosa, WL Brown, TJ Delph, ...
Microsystem technologies 12, 1045-1051, 2006
282006
Effects of electrical current and external stress on the electromigration of intermetallic compounds between the flip-chip solder and copper substrate
WJ Chen, YL Lee, TY Wu, TC Chen, CH Hsu, MT Lin
Journal of Electronic Materials 47, 35-48, 2018
242018
Viscoelastic mechanical properties measurement of thin Al and Al–Mg films using bulge testing
AW Huang, CH Lu, SC Wu, TC Chen, RP Vinci, WL Brown, MT Lin
Thin Solid Films 618, 2-7, 2016
222016
Optical micro-paddle beam deflection measurement for electrostatic mechanical testing of nano-scale thin film application to MEMS
CJ Tong, YC Cheng, MT Lin, KJ Chung, JS Hsu, CL Wu
microsystem technologies 16, 1131-1137, 2010
212010
Enhanced growth of the Ni3Sn4 phase at the Sn/Ni interface subjected to strains
WK Liao, CM Chen, MT Lin, CH Wang
Scripta Materialia 65 (8), 691-694, 2011
192011
Advancements in optical methods & digital image correlation in experimental mechanics
MT Lin, CA Sciammarella, HD Espinosa, C Furlong, L Lamberti, P Reu, ...
Springer, 2020
17*2020
Design and development of a novel paddle test structure for the mechanical behavior measurement of thin films application for MEMS
CJ Tong, MT Lin
Microsystem technologies 15, 1207-1216, 2009
172009
Heat dissipation performance for the application of light emitting diode
MT Lin, C Chang, RH Horng, DS Huang, CM Lai
2009 Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS, 145-149, 2009
172009
Cyclic creep and fatigue testing of nanocrystalline copper thin films
TC Hu, YT Wang, FC Hsu, PK Sun, MT Lin
Surface and Coatings Technology 215, 393-399, 2013
142013
Novel full range vacuum pressure sensing technique using free decay of trapezoid micro-cantilever beam deflected by electrostatic force
YT Wang, TC Hu, CJ Tong, MT Lin
Microsystem technologies 18, 1903-1908, 2012
132012
Three-phase linear motor heat transfer analysis using the finite-element method
DS Huang, JS Shih, HC Hsia, MT Lin
Heat Transfer Engineering 31 (7), 617-624, 2010
132010
Design and development of sub-micron scale specimens with electroplated structures for the microtensile testing of thin films
MT Lin, CJ Tong, CH Chiang
Microsystem technologies 13, 1559-1565, 2007
132007
A study of the phase transformation of low temperature deposited tantalum thin films using high power impulse magnetron sputtering and pulsed DC magnetron sputtering
WC Chen, ZY Wang, CY Yu, BH Liao, MT Lin
Surface and Coatings Technology 436, 128288, 2022
122022
Digital image correlation of SEM images for surface deformation of CMOS IC
TYF Chen, TC Chen, FY Cheng, AT Tsai, MT Lin
Microelectronic Engineering 201, 16-21, 2018
122018
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