| Two-dimensional mapping of chemical information at atomic resolution M Bosman, VJ Keast, JL Garcia-Munoz, AJ D’Alfonso, SD Findlay, ... Physical Review Letters 99 (8), 086102, 2007 | 316 | 2007 |
| Atomic-resolution chemical mapping using energy-dispersive x-ray spectroscopy AJ d’Alfonso, B Freitag, D Klenov, LJ Allen Physical Review B—Condensed Matter and Materials Physics 81 (10), 100101, 2010 | 287 | 2010 |
| Modelling the inelastic scattering of fast electrons LJ Allen, SD Findlay Ultramicroscopy 151, 11-22, 2015 | 242 | 2015 |
| Chemical mapping at atomic resolution using energy-dispersive x-ray spectroscopy LJ Allen, AJ D’Alfonso, B Freitag, DO Klenov MRS bulletin 37 (1), 47-52, 2012 | 184 | 2012 |
| Quantum mechanical model for phonon excitation in electron diffraction and imaging using a Born-Oppenheimer approximation BD Forbes, AV Martin, SD Findlay, AJ D’Alfonso, LJ Allen Physical Review B—Condensed Matter and Materials Physics 82 (10), 104103, 2010 | 172 | 2010 |
| Three-Dimensional Imaging of Individual Dopant Atoms in J Hwang, JY Zhang, AJ D’Alfonso, LJ Allen, S Stemmer Physical review letters 111 (26), 266101, 2013 | 113 | 2013 |
| Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images KE MacArthur, TJ Pennycook, E Okunishi, AJ D'Alfonso, NR Lugg, ... Ultramicroscopy 133, 109-119, 2013 | 104 | 2013 |
| Interpreting atomic-resolution spectroscopic images MP Oxley, M Varela, TJ Pennycook, K van Benthem, SD Findlay, ... Physical Review B—Condensed Matter and Materials Physics 76 (6), 064303, 2007 | 81 | 2007 |
| Contribution of thermally scattered electrons to atomic resolution elemental maps BD Forbes, AJ D'Alfonso, REA Williams, R Srinivasan, HL Fraser, ... Physical Review B—Condensed Matter and Materials Physics 86 (2), 024108, 2012 | 75 | 2012 |
| Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part I:: Elastic scattering EC Cosgriff, AJ D’Alfonso, LJ Allen, SD Findlay, AI Kirkland, PD Nellist Ultramicroscopy 108 (12), 1558-1566, 2008 | 75 | 2008 |
| Atom-scale ptychographic electron diffractive imaging of boron nitride cones CT Putkunz, AJ D’Alfonso, AJ Morgan, M Weyland, C Dwyer, L Bourgeois, ... Physical Review Letters 108 (7), 073901, 2012 | 74 | 2012 |
| Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy images JM LeBeau, AJ D’Alfonso, SD Findlay, S Stemmer, LJ Allen Physical Review B—Condensed Matter and Materials Physics 80 (17), 174106, 2009 | 68 | 2009 |
| Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopy Z Chen, M Weyland, X Sang, W Xu, JH Dycus, JM LeBeau, AJ d'Alfonso, ... Ultramicroscopy 168, 7-16, 2016 | 67 | 2016 |
| Deterministic electron ptychography at atomic resolution AJ D'alfonso, AJ Morgan, AWC Yan, P Wang, H Sawada, AI Kirkland, ... Physical Review B 89 (6), 064101, 2014 | 65 | 2014 |
| Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part II: Inelastic scattering AJ d’Alfonso, EC Cosgriff, SD Findlay, G Behan, AI Kirkland, PD Nellist, ... Ultramicroscopy 108 (12), 1567-1578, 2008 | 59 | 2008 |
| Contrast reversal in atomic-resolution chemical mapping P Wang, AJ D’Alfonso, SD Findlay, LJ Allen, AL Bleloch Physical review letters 101 (23), 236102, 2008 | 55 | 2008 |
| Surface determination through atomically resolved secondary-electron imaging J Ciston, HG Brown, AJ D’Alfonso, P Koirala, C Ophus, Y Lin, Y Suzuki, ... Nature Communications 6 (1), 7358, 2015 | 53 | 2015 |
| Energy dispersive X-ray analysis on an absolute scale in scanning transmission electron microscopy Z Chen, AJ D'Alfonso, M Weyland, DJ Taplin, LJ Allen, SD Findlay Ultramicroscopy 157, 21-26, 2015 | 50 | 2015 |
| Depth sectioning in scanning transmission electron microscopy based on core-loss spectroscopy AJ D’Alfonso, SD Findlay, MP Oxley, SJ Pennycook, K van Benthem, ... Ultramicroscopy 108 (1), 17-28, 2007 | 50 | 2007 |
| Determining ferroelectric polarity at the nanoscale JM LeBeau, AJ D’Alfonso, NJ Wright, LJ Allen, S Stemmer Applied Physics Letters 98 (5), 2011 | 45 | 2011 |
