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Suresh Kondati Natarajan
Suresh Kondati Natarajan
Synopsys QuantumATK
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Title
Cited by
Cited by
Year
Neural network molecular dynamics simulations of solid–liquid interfaces: water at low-index copper surfaces
S Kondati Natarajan, J Behler
Physical Chemistry Chemical Physics 18 (41), 28704-28725, 2016
1842016
Representing the potential-energy surface of protonated water clusters by high-dimensional neural network potentials
S Kondati Natarajan, T Morawietz, J Behler
Physical Chemistry Chemical Physics 17 (13), 8356-8371, 2015
872015
Equilibrium magnesium isotope fractionation between aqueous Mg 2+ and carbonate minerals: Insights from path integral molecular dynamics
C Pinilla, M Blanchard, E Balan, S Kondati Natarajan, R Vuilleumier, ...
Geochimica et Cosmochimica Acta, 2015
692015
Modeling the chemical mechanism of the thermal atomic layer etch of aluminum oxide: a density functional theory study of reactions during HF exposure
S Kondati Natarajan, SD Elliott
Chemistry of Materials 30 (17), 5912-5922, 2018
542018
Self-Diffusion of Surface Defects at Copper-Water Interfaces
S Kondati Natarajan, J Behler
The Journal of Physical Chemistry C, 2017
492017
Self-Limiting Temperature Window for Thermal Atomic Layer Etching of HfO2 and ZrO2 Based on the Atomic-Scale Mechanism
R Mullins, S Kondati Natarajan, SD Elliott, M Nolan
Chemistry of Materials 32 (8), 3414-3426, 2020
262020
Ru passivated and Ru doped ε-TaN surfaces as a combined barrier and liner material for copper interconnects: a first principles study
SK Natarajan, CL Nies, M Nolan
Journal of Materials Chemistry C 7 (26), 7959-7973, 2019
132019
The role of Ru passivation and doping on the barrier and seed layer properties of Ru-modified TaN for copper interconnects
S Kondati Natarajan, CL Nies, M Nolan
The Journal of chemical physics 152 (14), 2020
112020
Prediction and Validation of the Process Window for Atomic Layer Etching: HF Exposure on TiO2
S Kondati Natarajan, AM Cano, JL Partridge, SM George, SD Elliott
The Journal of Physical Chemistry C 125 (46), 25589-25599, 2021
102021
Control of the Cu morphology on Ru-passivated and Ru-doped TaN surfaces–promoting growth of 2D conducting copper for CMOS interconnects
CL Nies, SK Natarajan, M Nolan
Chemical Science 13 (3), 713-725, 2022
82022
Spontaneous etching of B2O3 by HF gas studied using infrared spectroscopy, mass spectrometry, and density functional theory
AM Cano, S Kondati Natarajan, JL Partridge, SD Elliott, SM George
Journal of Vacuum Science & Technology A 40 (2), 2022
62022
Mechanism of thermal atomic layer etch of W metal using sequential oxidation and chlorination: A first-principles study
S Kondati Natarajan, M Nolan, P Theofanis, C Mokhtarzadeh, ...
ACS applied materials & interfaces 12 (32), 36670-36680, 2020
62020
In silico design of a thermal atomic layer etch process of cobalt
S Kondati Natarajan, M Nolan, P Theofanis, C Mokhtarzadeh, ...
Journal of Vacuum Science & Technology A 39 (2), 2021
52021
Combining experimental and DFT investigation of the mechanism involved in thermal etching of titanium nitride using alternate exposures of NbF5 and CCl4, or CCl4 only
V Sharma, S Kondati Natarajan, SD Elliott, T Blomberg, S Haukka, ...
Advanced Materials Interfaces 8 (22), 2101085, 2021
32021
A Mechanistic Study of the HF Pulse in the Thermal Atomic Layer Etch of Crystalline and Amorphous HfO2
R Mullins, S Kondati Natarajan, M Nolan
Electrochemical Society Meeting Abstracts 240, 1705-1705, 2021
2021
TaN-Based Combined Barrier+ Liner Materials to Beat the Interconnect Bottleneck
CL Nies, S Kondati Natarajan, M Nolan
Electrochemical Society Meeting Abstracts 239, 1006-1006, 2021
2021
Modelling the Growth and Etch of Thin Film Metal Oxides
R Mullins, S Kondati Natarajan, M Nolan
Electrochemical Society Meeting Abstracts 239, 838-838, 2021
2021
Particle Swarm Based Hyper-Parameter Optimization for Machine Learned Interatomic Potentials
S Kondati Natarajan, M Caro
arXiv:2101.00049 [cond-mat.mtrl-sci], 2021
2021
New Materials to Battle the Transistor Interconnect Bottleneck
CL Nies, SK Natarajan, M Nolan
Electrochemical Society Meeting Abstracts 237, 1294-1294, 2020
2020
Ru passivated and Ru doped e-TaN surfaces as combined barrier and liner material for copper interconnects: a first principles study
S Kondati Natarajan, CL Nies, M Nolan
Royal Society of Chemistry, 2019
2019
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