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Rodrigo T. Doria
Rodrigo T. Doria
Verified email at fei.edu.br
Title
Cited by
Cited by
Year
Reduced electric field in junctionless transistors
JP Colinge, CW Lee, I Ferain, ND Akhavan, R Yan, P Razavi, R Yu, ...
Applied Physics Letters 96 (7), 2010
3732010
Low subthreshold slope in junctionless multigate transistors
CW Lee, AN Nazarov, I Ferain, ND Akhavan, R Yan, P Razavi, R Yu, ...
Applied Physics Letters 96 (10), 2010
2822010
Junctionless multiple-gate transistors for analog applications
RT Doria, MA Pavanello, RD Trevisoli, M de Souza, CW Lee, I Ferain, ...
IEEE Transactions on Electron Devices 58 (8), 2511-2519, 2011
2792011
Threshold voltage in junctionless nanowire transistors
RD Trevisoli, RT Doria, M de Souza, MA Pavanello
Semiconductor Science and Technology 26 (10), 105009, 2011
1292011
Surface-Potential-Based Drain Current Analytical Model for Triple-Gate Junctionless Nanowire Transistors
RD Trevisoli, RT Doria, M de Souza, S Das, I Ferain, MA Pavanello
Electron Devices, IEEE Transactions on 59 (12), 3510 - 3518, 2012
1262012
Impact of the series resistance in the IV characteristics of junctionless nanowire transistors and its dependence on the temperature
RT Doria, RD Trevisoli, M de Souza, MA Pavanello
Journal of Integrated Circuits and Systems 7 (2), 121-129, 2012
642012
Cryogenic operation of junctionless nanowire transistors
M de Souza, MA Pavanello, RD Trevisoli, RT Doria, JP Colinge
IEEE Electron Device Letters 32 (10), 1322-1324, 2011
612011
A physically-based threshold voltage definition, extraction and analytical model for junctionless nanowire transistors
RD Trevisoli, RT Doria, M de Souza, MA Pavanello
Solid-State Electronics 90, 12-17, 2013
582013
Charge-based continuous model for long-channel symmetric double-gate junctionless transistors
A Cerdeira, M Estrada, B Iniguez, RD Trevisoli, RT Doria, M De Souza, ...
Solid-State Electronics 85, 59-63, 2013
472013
The zero temperature coefficient in junctionless nanowire transistors
R Doria Trevisoli, R Trevisoli Doria, M de Souza, S Das, I Ferain, ...
Applied Physics Letters 101 (6), 2012
392012
Substrate bias influence on the operation of junctionless nanowire transistors
R Trevisoli, RT Doria, M de Souza, MA Pavanello
IEEE Transactions on Electron Devices 61 (5), 1575-1582, 2014
382014
Harmonic distortion of unstrained and strained FinFETs operating in saturation
RT Doria, A Cerdeira, JA Martino, E Simoen, C Claeys, MA Pavanello
IEEE transactions on electron devices 57 (12), 3303-3311, 2010
322010
Harmonic distortion analysis of double gate graded-channel MOSFETs operating in saturation
RT Doria, A Cerdeira, JP Raskin, D Flandre, MA Pavanello
Microelectronics journal 39 (12), 1663-1670, 2008
302008
Illuminated to dark ratio improvement in lateral SOI PIN photodiodes at high temperatures
C Novo, R Giacomini, R Doria, A Afzalian, D Flandre
Semiconductor Science and Technology 29 (7), 075008, 2014
282014
Analysis of the leakage current in junctionless nanowire transistors
R Trevisoli, R Trevisoli Doria, M de Souza, M Antonio Pavanello
Applied Physics Letters 103 (20), 2013
282013
Analytical Model for the Dynamic Behavior of Triple-Gate Junctionless Nanowire Transistors
R Trevisoli, RT Doria, M de Souza, S Barraud, M Vinet, MA Pavanello
IEEE Transactions on Electron Devices 63 (2), 856-863, 2016
262016
On the improvement of DC analog characteristics of FD SOI transistors by using asymmetric self-cascode configuration
M de Souza, D Flandre, RT Doria, R Trevisoli, MA Pavanello
Solid-State Electronics 117, 152-160, 2016
252016
Analog operation temperature dependence of nMOS junctionless transistors focusing on harmonic distortion
RT Doria, MA Pavanello, RD Trevisoli, M de Souza, CW Lee, I Ferain, ...
Journal of Integrated Circuits and Systems 6 (2), 114-121, 2011
242011
A new method for series resistance extraction of nanometer MOSFETs
R Trevisoli, RT Doria, M de Souza, S Barraud, M Vinet, M Casse, ...
IEEE Transactions on Electron Devices 64 (7), 2797-2803, 2017
212017
Junctionless nanowire transistors operation at temperatures down to 4.2 K
R Trevisoli, M De Souza, RT Doria, V Kilchtyska, D Flandre, MA Pavanello
Semiconductor Science and Technology 31 (11), 114001, 2016
212016
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