Address sequences and backgrounds with different Hamming distances for multiple run March tests S Yarmolik International journal of applied mathematics and computer science 18 (3 …, 2008 | 28 | 2008 |
Multi background memory testing SV Yarmolik, I Mrozek 2007 14th International Conference on Mixed Design of Integrated Circuits …, 2007 | 21 | 2007 |
Address sequences for multiple run march tests VN Yarmolik, SV Yarmolik Automatic Control and Computer Sciences 5, 59-68, 2006 | 19 | 2006 |
Counter sequences for memory test address generation VN Yarmolik, B Sokol, SV Yarmolik Mixed Design of Integrated Circuits and Systems: proc. 12th International …, 2005 | 16 | 2005 |
Modified gray and counter sequences for memory test address generation SV Yarmolik, VN Yarmolik Proceedings of the International Conference Mixed Design of Integrated …, 2006 | 15 | 2006 |
Address sequences for march tests to detect pattern sensitive faults B Sokol, SV Yarmolik Third IEEE International Workshop on Electronic Design, Test and …, 2006 | 15 | 2006 |
Marshevye testy dlya samotestirovaniya OZU SV Yarmolik, AP Zankovich, AA Ivanyuk RAM Self-Test March Tests, 2009 | 13 | 2009 |
Quasi-random testing of computer systems SV Yarmolik, VN Yarmolik Informatics, 65-81, 2016 | 11 | 2016 |
Controlled random tests SV Yarmolik, VN Yarmolik Automation and Remote Control 73, 1704-1714, 2012 | 11 | 2012 |
The synthesis of probability tests with a small number of kits SV Yarmolik, VN Yarmolik Automatic Control and Computer Sciences 45, 133-141, 2011 | 11 | 2011 |
The repeated nondestructive march tests with variable address sequences VN Yarmolik, SV Yarmolik Automation and Remote Control 68, 688-698, 2007 | 11 | 2007 |
Memory address generation for multiple run march tests with different average hamming distance SV Yarmolik, VN Yarmolik Proc. IEEE East-West Design & Test Workshop (EWDTW’06), 212-216, 2006 | 11 | 2006 |
Optimal memory address seeds for pattern sensitive faults detection SV Yarmolik, B Sokol 2006 IEEE Design and Diagnostics of Electronic Circuits and systems, 218-219, 2006 | 11 | 2006 |
Generating modified Sobol sequences for multiple run march memory tests VN Yarmolik, SV Yarmolik Automatic Control and Computer Sciences 47, 242-247, 2013 | 8 | 2013 |
Address sequences VN Yarmolik, SV Yarmolik Automatic Control and Computer Sciences 48, 207-213, 2014 | 7 | 2014 |
Controlled method of random test synthesis VN Yarmolik, I Mrozek, SV Yarmolik Automatic Control and Computer Sciences 49, 395-403, 2015 | 6 | 2015 |
Controlled random testing SV Yarmolik, VN Yarmolik Informatika 1, 79-88, 2011 | 5 | 2011 |
Iterative near pseudoexhaustive random testing S Yarmolik Informatics 2 (26), 66-75, 2010 | 5 | 2010 |
Memory pattern sensitive faults detection using multiple runs of March tests SV Yarmolik, Y VN Informatics 1 (9), 104-113, 2006 | 5 | 2006 |
Address sequences generation for multiple run memory testing SV Yarmolik, I Mrozek, B Sokol 6th International Conference on Computer Information Systems and Industrial …, 2007 | 4 | 2007 |