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Dinesh Gaitonde
Dinesh Gaitonde
Senior Fellow, AMD
Verified email at amd.com
Title
Cited by
Cited by
Year
Xilinx Adaptive Compute Acceleration Platform: VersalTM Architecture
B Gaide, D Gaitonde, C Ravishankar, T Bauer
Proceedings of the 2019 ACM/SIGDA International Symposium on Field …, 2019
1542019
Method for design optimization using logical and physical information
L Pileggi, M Sarrafzadeh, S Malik, A Chakraborty, A Li, RE Shortt, C Dunn, ...
US Patent 6,286,128, 2001
1542001
Network-on-Chip Programmable Platform in VersalTM ACAP Architecture
I Swarbrick, D Gaitonde, S Ahmad, B Gaide, Y Arbel
Proceedings of the 2019 ACM/SIGDA International Symposium on Field …, 2019
552019
Hierarchical mapping of spot defects to catastrophic faults-design and applications
DD Gaitonde, DMH Walker
IEEE Transactions on Semiconductor Manufacturing 8 (2), 167-177, 1995
311995
Enhancements in UltraScale CLB architecture
S Chandrakar, D Gaitonde, T Bauer
Proceedings of the 2015 ACM/SIGDA International Symposium on Field …, 2015
302015
A domain-specific architecture for accelerating sparse matrix vector multiplication on fpgas
AK Jain, H Omidian, H Fraisse, M Benipal, L Liu, D Gaitonde
2020 30th International conference on field-programmable logic and …, 2020
272020
Boolean satisfiability-based routing and its application to xilinx ultrascale clock network
H Fraisse, A Joshi, D Gaitonde, A Kaviani
Proceedings of the 2016 ACM/SIGDA International Symposium on Field …, 2016
252016
Placement strategies for 2.5 D FPGA fabric architectures
C Ravishankar, D Gaitonde, T Bauer
2018 28th International Conference on Field Programmable Logic and …, 2018
182018
Versal network-on-chip (NoC)
I Swarbrick, D Gaitonde, S Ahmad, B Jayadev, J Cuppett, A Morshed, ...
2019 IEEE Symposium on High-Performance Interconnects (HOTI), 13-17, 2019
172019
Test quality and yield analysis using the DEFAM defect to fault mapper
DD Gaitonde, DMH Walker
Proceedings of 1993 International Conference on Computer Aided Design (ICCAD …, 1993
141993
Clock network architecture
BC Gaide, SP Young, TJ Bauer, RM Ondris, DD Gaitonde
US Patent 8,937,491, 2015
122015
Circuit-level modeling of spot defects
D Gaitonde, DMH Walker
1991 International Workshop on Defect and Fault Tolerance on VLSI Systems …, 1991
121991
Modular and lean architecture with elasticity for sparse matrix vector multiplication on fpgas
AK Jain, C Ravishankar, H Omidian, S Kumar, M Kulkarni, A Tripathi, ...
2023 IEEE 31st Annual International Symposium on Field-Programmable Custom …, 2023
82023
A SAT-based timing driven place and route flow for critical soft IP
H Fraisse, D Gaitonde
2018 28th International Conference on Field Programmable Logic and …, 2018
82018
Sparse deep neural network acceleration on HBM-enabled FPGA platform
AK Jain, S Kumar, A Tripathi, D Gaitonde
2021 IEEE High Performance Extreme Computing Conference (HPEC), 1-7, 2021
72021
Configurable network-on-chip for a programmable device
IA Swarbrick, S Ahmad, Y Arbel, DD Gaitonde
US Patent 10,838,908, 2020
72020
Clock speed for a digital circuit
S Srinivasan, DD Gaitonde
US Patent 8,024,696, 2011
72011
Method and apparatus for generating sign-off prototypes for the design and fabrication of integrated circuits
SR Raje, LT Pileggi, DD Gaitonde, OR Coudert, P Gopalakrishnan, ...
US Patent 6,775,808, 2004
72004
Design and applications of a hierarchical defect to fault mapper.
DD Gaitonde
71996
Accurate yield estimation of circuits with redundancy
DD Gaitonde, DMH Walker, W Maly
Proceedings of International Workshop on Defect and Fault Tolerance in VLSI …, 1995
71995
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