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Co-authors
- Qingsen ZengSeoul National University, Jilin UniversityVerified email at jlu.edu.cn
- Puxian GaoUniversity of ConnecticutVerified email at uconn.edu
- Zhaolai ChenShandong UniversityVerified email at sdu.edu.cn
- Xingxu Lu(鹿行旭)Research Scientist, Geely GroupVerified email at uconn.edu
- Wenxiang TangSichuan UniversityVerified email at scu.edu.cn
- Steve SuibUniversity of ConnecticutVerified email at uconn.edu
- Chunxiang ZhuUniversity of ConnecticutVerified email at uconn.edu
- Baikun LiUniversity of ConnecticutVerified email at uconn.edu
- Yingzheng FanPostdoctoral Associate, Yale UniversityVerified email at yale.edu
- Jiyu SunUniversity of ConnecticutVerified email at uconn.edu
- Yu Fu (付昱)Hong Kong University of Science and TechnologyVerified email at connect.ust.hk
- Shoujun ZhuJilin University, NIH, Stanford UniversityVerified email at stanford.edu
- Guoan ZhengAssociate Professor, University of ConnecticutVerified email at uconn.edu
- Yong DingIMS and MSE, Georgia Institute of TechnologyVerified email at mse.gatech.edu
- Xingyu WangUniversity of ConnecticutVerified email at uconn.edu
- Haiyan TanNational Institute of Standards and Technology, USAVerified email at nist.gov
- Liaoyong WenAssistant Professor, School of Engineering, Westlake UniversityVerified email at westlake.edu.cn
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Fangyuan Liu
Postdoctoral Associate, Yale University, University of Connecticut, Jilin University
Verified email at yale.edu