Articles with public access mandates - Sandra Van AertLearn more
Not available anywhere: 33
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy
S Van Aert, J Verbeeck, R Erni, S Bals, M Luysberg, D Van Dyck, ...
Ultramicroscopy 109 (10), 1236-1244, 2009
Mandates: Research Foundation (Flanders)
Three-dimensional elemental mapping at the atomic scale in bimetallic nanocrystals
B Goris, A De Backer, S Van Aert, S Gómez-Graña, LM Liz-Marzán, ...
Nano letters 13 (9), 4236-4241, 2013
Mandates: Research Foundation (Flanders)
Incommensurate Modulation and Luminescence in the CaGd2(1–x)Eu2x(MoO4)4(1–y)(WO4)4y (0 ≤ x ≤ 1, 0 ≤ y ≤ 1) Red Phosphors
VA Morozov, A Bertha, KW Meert, S Van Rompaey, D Batuk, GT Martinez, ...
Chemistry of Materials 25 (21), 4387-4395, 2013
Mandates: Research Foundation (Flanders)
Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy
GT Martinez, A Rosenauer, A De Backer, J Verbeeck, S Van Aert
Ultramicroscopy 137, 12-19, 2014
Mandates: Research Foundation (Flanders), German Research Foundation
Progress and new advances in simulating electron microscopy datasets using MULTEM
I Lobato, S Van Aert, J Verbeeck
Ultramicroscopy 168, 17-27, 2016
Mandates: Research Foundation (Flanders)
Electron channelling based crystallography
S Van Aert, P Geuens, D Van Dyck, C Kisielowski, JR Jinschek
Ultramicroscopy 107 (6-7), 551-558, 2007
Mandates: Research Foundation (Flanders)
Direct structure inversion from exit waves: part I: theory and simulations
A Wang, FR Chen, S Van Aert, D Van Dyck
Ultramicroscopy 110 (5), 527-534, 2010
Mandates: Research Foundation (Flanders)
High resolution electron tomography
S Bals, S Van Aert, G Van Tendeloo
Current Opinion in Solid State and Materials Science 17 (3), 107-114, 2013
Mandates: Research Foundation (Flanders)
A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy
W Van den Broek, S Van Aert, D Van Dyck
Ultramicroscopy 110 (5), 548-554, 2010
Mandates: Research Foundation (Flanders)
Model-based electron microscopy: From images toward precise numbers for unknown structure parameters
S Van Aert, W Van den Broek, P Goos, D Van Dyck
Micron 43 (4), 509-515, 2012
Mandates: Research Foundation (Flanders)
Direct structure inversion from exit waves. Part II: A practical example
A Wang, FR Chen, S Van Aert, D Van Dyck
Ultramicroscopy 116, 77-85, 2012
Mandates: Research Foundation (Flanders)
Effect of amorphous layers on the interpretation of restored exit waves
S Van Aert, LY Chang, S Bals, AI Kirkland, G Van Tendeloo
Ultramicroscopy 109 (3), 237-246, 2009
Mandates: Research Foundation (Flanders)
Throughput maximization of particle radius measurements through balancing size versus current of the electron probe
W Van den Broek, S Van Aert, P Goos, D Van Dyck
Ultramicroscopy 111 (7), 940-947, 2011
Mandates: Research Foundation (Flanders)
Precision of three-dimensional atomic scale measurements from HRTEM images: What are the limits?
A Wang, S Van Aert, P Goos, D Van Dyck
Ultramicroscopy 114, 20-30, 2012
Mandates: Research Foundation (Flanders)
Linear versus non-linear structural information limit in high-resolution transmission electron microscopy
S Van Aert, JH Chen, D Van Dyck
Ultramicroscopy 110 (11), 1404-1410, 2010
Mandates: Research Foundation (Flanders)
Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors
DG Sentürk, A De Backer, T Friedrich, S Van Aert
Ultramicroscopy 242, 113626, 2022
Mandates: Research Foundation (Flanders), European Commission
A method to determine the local surface profile from reconstructed exit waves
A Wang, FR Chen, S Van Aert, D Van Dyck
Ultramicroscopy 111 (8), 1352-1359, 2011
Mandates: Research Foundation (Flanders)
Statistical parameter estimation theory: principles and simulation studies
A De Backer, J Fatermans, AJ den Dekker, S Van Aert
Advances in Imaging and Electron Physics 217, 29-72, 2021
Mandates: Research Foundation (Flanders), European Commission
Atom column detection
J Fatermans, A De Backer, AJ den Dekker, S Van Aert
Advances in Imaging and Electron Physics 217, 177-214, 2021
Mandates: Research Foundation (Flanders), European Commission
Atom counting from a combination of two ADF STEM images
DG Şentürk, CP Yu, A De Backer, S Van Aert
Ultramicroscopy 255, 113859, 2024
Mandates: European Commission
Publication and funding information is determined automatically by a computer program