| Practical surface analysis D Briggs Auger and X-Ray Photoelecton Spectroscory 1, 151-152, 1990 | 11245* | 1990 |
| Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids MP Seah, WA Dench Surface and interface analysis 1 (1), 2-11, 1979 | 7408 | 1979 |
| Elastic scattering corrections in AES and XPS. II. Estimating attenuation lengths and conditions required for their valid use in overlayer/substrate experiments PJ Cumpson, MP Seah Surface and Interface Analysis: An International Journal devoted to the …, 1997 | 724 | 1997 |
| Segregation to interfaces ED Hondros, MP Seah International Metals Reviews 22 (1), 262-301, 1977 | 614 | 1977 |
| Grain boundary segregation MP Seah, ED Hondros Proceedings of the Royal Society of London A: Mathematical, Physical and …, 1973 | 577 | 1973 |
| The quantitative analysis of surfaces by XPS: A review MP Seah Surface and Interface Analysis 2 (6), 222-239, 1980 | 540 | 1980 |
| Adsorption-induced interface decohesion MP Seah Acta Metallurgica 28 (7), 955-962, 1980 | 494 | 1980 |
| Quantitative Auger electron spectroscopy and electron ranges MP Seah Surface Science 32 (3), 703-728, 1972 | 493 | 1972 |
| The theory of grain boundary segregation in terms of surface adsorption analogues ED Hondros, MP Seah Metallurgical Transactions A 8, 1363-1371, 1977 | 368 | 1977 |
| XPS: binding energy calibration of electron spectrometers 5—re‐evaluation of the reference energies MP Seah, IS Gilmore, G Beamson Surface and Interface Analysis: An International Journal devoted to the …, 1998 | 363 | 1998 |
| Quantitative Electron Spectroscopy of Surfaces: A Standard Data Base for Electron Inelastic Mean Free Path in Solids WA Dench, MP Seah Surf. Interf. Anal 1, 1, 1979 | 361 | 1979 |
| Quantification in AES and XPS MP Seah Quantitative Microbeam Analysis, 1-42, 2017 | 357* | 2017 |
| XPS: Energy calibration of electron spectrometers. 1—An absolute, traceable energy calibration and the provision of atomic reference line energies MT Anthony, MP Seah Surface and interface analysis 6 (3), 95-106, 1984 | 334 | 1984 |
| Precision, accuracy, and uncertainty in quantitative surface analyses by Auger‐electron spectroscopy and x‐ray photoelectron spectroscopy CJ Powell, MP Seah Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 8 (2 …, 1990 | 323 | 1990 |
| Grain boundary segregation MP Seah Journal of Physics F: Metal Physics 10 (6), 1043, 1980 | 292 | 1980 |
| Interface adsorption, embrittlement and fracture in metallurgy: A review MP Seah Surface Science 53 (1), 168-212, 1975 | 292 | 1975 |
| Summary of ISO/TC 201 Standard: VII ISO 15472: 2001—surface chemical analysis—x‐ray photoelectron spectrometers—calibration of energy scales MP Seah Surface and Interface Analysis: An International Journal devoted to the …, 2001 | 285 | 2001 |
| POST‐1989 calibration energies for x‐ray photoelectron spectrometers and the 1990 JOSEPHSON constant MP Seah Surface and Interface Analysis 14 (8), 488-488, 1989 | 282 | 1989 |
| Ultrathin SiO2 on Si II. Issues in quantification of the oxide thickness MP Seah, SJ Spencer Surface and Interface Analysis: An International Journal devoted to the …, 2002 | 259 | 2002 |
| Grain boundary segregation and the Tt dependence of temper brittleness MP Seah Acta metallurgica 25 (3), 345-357, 1977 | 248 | 1977 |