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Title
Cited by
Cited by
Year
Method of processing a high voltage p++/n-well junction and a device manufactured by the method
M Vermandel, A Van Calster, P Moens, H Van Hove, M Tack
US Patent App. 09/950,835, 2002
1332002
A Comparison Between Silicon Nitride Films Made by PCVD of N 2‐SiH4/Ar and N 2‐SiH4/He
K Allaert, A Van Calster, H Loos, A Lequesne
Journal of the Electrochemical Society 132 (7), 1763, 1985
941985
Polycrystalline CdSe films for thin film transistors
A Van Calster, A Vervaet, I De Rycke, J De Baets, J Vanfleteren
Journal of Crystal Growth 86 (1-4), 924-928, 1988
831988
Influence of chemical pretreatment of epoxy polymers on the adhesion strength of electrochemically deposited Cu for use in electronic interconnections
S Siau, A Vervaet, E Schacht, A Van Calster
Journal of the Electrochemical Society 151 (2), C133, 2004
612004
Adhesion strength of the epoxy polymer/copper interface for use in microelectronics
S Siau, A Vervaet, L Van Vaeck, E Schacht, U Demeter, A Van Calster
Journal of the electrochemical society 152 (6), C442, 2005
542005
Epoxy polymer surface modification through wet-chemical organic surface synthesis for adhesion improvement in microelectronics
S Siau, A Vervaet, E Schacht, U Demeter, A Van Calster
Thin Solid Films 495 (1-2), 348-356, 2006
442006
Design, fabrication and evaluation of a high-performance XGA VAN-LCOS microdisplay
H De Smet, D Cuypers, A Van Calster, J Van den Steen, ...
Displays 23 (3), 89-98, 2002
432002
Method for measuring the cell gap in liquid-crystal displays
F Bruyneel, H De Smet, J Vanfleteren, A Van Calster
Optical Engineering 40 (2), 259-267, 2001
432001
Influence of wet chemical treatments on the evolution of epoxy polymer layer surface roughness for use as a build-up layer
S Siau, A Vervaet, A Van Calster, I Swennen, E Schacht
Applied surface science 237 (1-4), 457-462, 2004
422004
Stabilizer concentration and local environment: Their effects on electroless nickel plating of PCB micropads
S Zhang, J De Baets, M Vereeken, A Vervaet, A Van Calster
Journal of the Electrochemical Society 146 (8), 2870, 1999
421999
Kinetic study of wet chemical treatments on the surface roughness of epoxy polymer layers for buildup layers: I. Sweller influence
S Siau, A Vervaet, S Nalines, E Schacht, A Van Calster
Journal of the Electrochemical Society 151 (12), C816, 2004
392004
Kinetic study of wet chemical treatments on the surface roughness of epoxy polymer layers for buildup layers: II. Oxidative Treatment of the surface
S Siau, A Vervaet, S Nalines, E Schacht, A Van Calster
Journal of the Electrochemical Society 151 (12), C831, 2004
392004
On the field effect in polycrystalline CdSe thin‐film transistors
A Van Calster, J Vanfleteren, I De Rycke, J De Baets
Journal of applied physics 64 (6), 3282-3286, 1988
391988
VAN LCOS microdisplays: A decade of technological evolution
D Cuypers, H De Smet, A Van Calster
Journal of Display Technology 7 (3), 127-134, 2011
372011
Introduction of amino groups on the surface of thin photo definable epoxy resin layers via chemical modification
D Schaubroeck, J De Baets, T Desmet, S Van Vlierberghe, E Schacht, ...
Applied Surface Science 255 (21), 8780-8787, 2009
372009
A versatile micropower high-voltage flat-panel display driver in a 100-V 0.7-/spl mu/m CMOS intelligent interface technology
J Doutreloigne, H De Smet, A Van Calster
IEEE Journal of Solid-State Circuits 36 (12), 2039-2048, 2001
322001
Surface modification of a photo-definable epoxy resin with polydopamine to improve adhesion with electroless deposited copper
D Schaubroeck, E Van Den Eeckhout, J De Baets, P Dubruel, ...
Journal of adhesion science and technology 26 (18-19), 2301-2314, 2012
312012
The measuring of 1/f noise of thick and thin film resistors
S Demolder, M Vandendriessche, A Van Calster
Journal of Physics E: Scientific Instruments 13 (12), 1323, 1980
291980
Surface modification of an epoxy resin with polyamines via cyanuric chloride coupling
D Schaubroeck, J De Baets, T Desmet, P Dubruel, E Schacht, ...
Applied Surface Science 256 (21), 6269-6278, 2010
282010
Qualitative electroless Ni/Au plating considerations for the solder mask on top of sequential build-up layers
S Siau, A Vervaet, L Degrendele, J De Baets, A Van Calster
Applied surface science 252 (8), 2717-2740, 2006
262006
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