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Co-authors
- Raghunath HolambeSGGS Inst of Engg and Tech, Vishnupuri, Nanded, IndiaVerified email at sggs.ac.in
- Vikram GadreProfessor, Electrical Engineering, IIT BombayVerified email at ee.iitb.ac.in
- Pushkar G PatwardhanIndian Institute of Technology, BombayVerified email at tensilica.com
- Mukund B. NagareSGGS Institute of Engineering and Technolgy, NandedVerified email at sggs.ac.in
- Rajesh LangojuEPFLVerified email at ge.com
- Swati MadheAsst. Prof, Instrumentaion & Control, Cummins College of Engineering.Verified email at cumminscollege.in
- Dr. Parul Arora BhalotraE&TC savitribai Phule Pune UniversityVerified email at raisoni.net
- Dr. Amol D. RahulkarNational Institute of Technology (NIT), GoaVerified email at nitgoa.ac.in
- Nilam GhugeProfessor in Electrical EngineeringVerified email at jspmbsiotr.edu.in
- Suresh Emmanuel JoelGeneral Electric Global ResearchVerified email at ge.com
- Pavan AnnangiGEVerified email at ge.com
- Aditya HegdeJohns Hopkins UniversityVerified email at cs.jhu.edu
- Pavan SudheendraDirector, Samsung R&D Institute India-BangaloreVerified email at samsung.com
- Mahesh PanickerAssociate Professor, Singapore Institute of Technology (SIT)Verified email at singaporetech.edu.sg
- Radhika MadhavanGE Global ResearchVerified email at ge.com
- Abhijit PatilEcole Polytechnique Federale de LausanneVerified email at ge.com
- Sahika GencAmazon Web ServicesVerified email at amazon.com
- Navneeth SubramanianCanon IncVerified email at canon.co.jp
- Sandeep KaushikMR AI Lead Scientist, GE HealthCare, MunichVerified email at ge.com
- Rakesh MullickGE Global Research CenterVerified email at ge.com