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Co-authors
Terence HookIBMVerified email at us.ibm.com
Jed RankinIBMVerified email at ibm.com
Benton CalhounProfessor of Electrical and Computer Engineering, University of VirginiaVerified email at virginia.edu
Jiajing WangPrinciple Hardware Engineer, Oracle Corp.Verified email at oracle.com
James W AdkissonIBMVerified email at us.ibm.com
Carl RadensIBM ResearchVerified email at ibm.com
Azeez BhavnagarwalaMetis MicrosystemsVerified email at metismicro.com
Brent AndersonSenior Staff Engineer at IBMVerified email at us.ibm.com
Sudhanshu KhannaTexas Instruments DallasVerified email at ti.com
Christian LavoieIBM T.J. Watson Research CenterVerified email at us.ibm.com
David J FrankIBM Watson Research CenterVerified email at us.ibm.com
SUBRAMANIAN S. IYERUniversity of California at Los Angeles,Verified email at g.ucla.edu
Yoann Mamy RandriamihajaVerified email at st.com
Mircea R. StanVirginia Microelectronics Consortium (VMEC) Professor, University of VirginiaVerified email at virginia.edu
Vivek JoshiGLOBALFOUNDRIES, University of MichiganVerified email at umich.edu