Profils

Charlie Kong

Senior Research Officer, University of New South Wales

Adresse e-mail validée de unsw.edu.au

Cité 6655 fois

Materials Science Electron Microscopy Focused Ion Beam

Ian MacLaren

University of Glasgow, School of Physics and Astronomy

Adresse e-mail validée de glasgow.ac.uk

Cité 5292 fois

Electron Microscopy Nanostructure Electron Energy Loss Spectroscopy Direct Electron Detectors Focused Ion Beam

Yuval Greenzweig

None

Cité 4767 fois

planetary science Semiconductor technology circuit edit focused ion beam

Philip Moll

Max-Planck-Institute for the Structure and Dynamics of Matter, Hamburg, Germany

Adresse e-mail validée de mpsd.mpg.de

Cité 4242 fois

Topological semi-metals Superconductivity correlated electrons Focused Ion Beam

Braulio Archanjo

National Institute of Metrology, Quality and Technology of Brazil

Adresse e-mail validée de inmetro.gov.br

Cité 4192 fois

Nanometrology Electron Microscopy Atomic Force Microscopy Nanofabrication Focused Ion Beam

Christian Boit

Professor für Halbleiterbauelemente, TU Berlin

Adresse e-mail validée de tu-berlin.de

Cité 4162 fois

optical interactions of electronic devices focused ion beam

David C Cox

Principal Research Fellow, University of Surrey

Adresse e-mail validée de surrey.ac.uk

Cité 4162 fois

Focused ion beam Nanofabrication

Lifei Xi

FACTS@Nanyang Technological University

Adresse e-mail validée de ntu.edu.sg

Cité 3885 fois

Catalyst Nanoparticle-plant interaction Novel Materials Focused Ion Beam TEM

Markus Becherer

Technische Universtität München, TUM

Adresse e-mail validée de tum.de

Cité 3381 fois

semiconductors chip-based sensors micormagnetics novel fabrication technology focused-ion-beam

Emmanuelle Boehm-Courjault

EPFL-Laboratory for Construction Materials

Adresse e-mail validée de epfl.ch

Cité 2266 fois

Concrete chemistry cementitious materials scanning electron microscopy transmission electron microscopy focused ion beam

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