个人学术档案

Takashi Sekiguchi

Faculty of Pure & Applied Sciences, Univ. Tsukuba

在 u.tsukuba.ac.jp 的电子邮件经过验证

被引用次数：20136

Electron Microscopy defects in semiconductors

Seibt

Professor of Physics, Goettingen University

在 gwdg.de 的电子邮件经过验证

被引用次数：7515

Defects in Semiconductors Transmission electron microscopy Structure and properties of interfaces

SK Estreicher

Texas Tech University

在 ttu.edu 的电子邮件经过验证

被引用次数：7056

defects in semiconductors

Lutz Kirste

Dr. rer. nat., Fraunhofer IAF

在 iaf.fraunhofer.de 的电子邮件经过验证

被引用次数：4665

Defects in semiconductors

Behrang H. Hamadani

National Institute of Standards and Technology

在 nist.gov 的电子邮件经过验证

被引用次数：3764

photovoltaics wide bandgap materials device characterization physics defects in semiconductors

Lourdes Pelaz

University of Valladolid

在 ele.uva.es 的电子邮件经过验证

被引用次数：3552

Semiconductor process modeling defects in semiconductors

Damien West

Research Scientist, Rensselaer Polytechnic Institute

在 rpi.edu 的电子邮件经过验证

被引用次数：3044

defects in semiconductors statistical physics topological insulators

Susanne Mirbt

Professor of Physics, Uppsala University

在 physics.uu.se 的电子邮件经过验证

被引用次数：2628

defects in semiconductors polarons interfaces

Ravindran Vidya

Associate Professor, Department of Physics, Anna University

在 annauniv.edu 的电子邮件经过验证

被引用次数：2384

Density functional calculations Perovskite Oxides Transition-metal Oxides Defects in semiconductors Optical properties

Roman Gröger

Institute of Physics of Materials, Czech Academy of Sciences

在 ipm.cz 的电子邮件经过验证

被引用次数：1765

atomistic simulations dislocations coarse-graining defects in semiconductors image simulation

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