Redefining the speed limit of phase change memory revealed by time-resolved steep threshold-switching dynamics of AgInSbTe devices KD Shukla, N Saxena, S Durai, A Manivannan Scientific Reports 6 (1), 37868, 2016 | 41 | 2016 |
Direct Evidence for a Systematic Evolution of Optical Band Gap and Local Disorder in Ag, In Doped Sb2Te Phase Change Material KD Shukla, S Sahu, A Manivannan, UP Deshpande physica status solidi (RRL)–Rapid Research Letters 11 (12), 1700273, 2017 | 12 | 2017 |
Temperature dependent structural evolution and crystallization properties of thin Ge15Te85 film revealed by in situ resistance, x-ray diffraction and scanning electron … R Sengottaiyan, N Saxena, KD Shukla, A Manivannan Journal of Physics D: Applied Physics 53 (2), 025108, 2019 | 11 | 2019 |
Rapid threshold switching dynamics of co-sputtered chalcogenide Ge15Te85 device for selector application R Sengottaiyan, N Saxena, KD Shukla, A Manivannan Semiconductor Science and Technology 36 (1), 015013, 2020 | 7 | 2020 |
An ultrafast programmable electrical tester for enabling time-resolved, sub-nanosecond switching dynamics and programming of nanoscale memory devices KD Shukla, N Saxena, A Manivannan Review of Scientific Instruments 88 (12), 2017 | 7 | 2017 |
Design A 1Bit Low Power Full Adder Using Cadence Tool K Khare, KD Shukla AIP Conference Proceedings 1324 (1), 373-376, 2010 | 7 | 2010 |
Exploring the dynamics of threshold switching and electronic properties of Ag, In-doped Sb2 Te phase change material for universal memory KD Shukla Department of Electrical Engineering, IIT Indore, 2018 | | 2018 |
LabVIEW controlled Ultrafast Programmable Electrical Tester for Nanoscale Device Characterization G Bishnoi, KH Kumar, KD Shukla, M Anbarasu | | |